Source Measure Units
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Source Measure Units
What is a Source Measure Unit (SMU)?
The Source Measure Unit (SMU) is an instrument that can precisely source voltage or current and simultaneously measure voltage and/or current. It combines the useful features of a digital multimeter (DMM), power supply, true current source, electronic load and pulse generator, all into a single, tightly synchronized instrument in a compact form factor. SMUs are considered more useful than the combination of any of the five instruments, due to the measuring instrument’s versatility and high accuracy performance.
Keithley 2400 Graphical Touchscreen Series SMU
- Nanostructured Materials Research
- Power Semiconductor GaN, SiC
- Biosensor Development
- Semiconductor Device Design
- Automotive Sensor Design
SMU 2600B: Single or Dual Channel Systems
- Semiconductor Production Test
- Semiconductor Device Design
- Transistor Characterization
- IDDQ Testing and Standby Current Testing
- Multi-Pin Device Test
2601B-PULSE System SourceMeter® 10 μs Pulser/SMU Instrument
- VCSEL Test for LIDAR
- High Brightness LED Test
- Laser Diode Production Test
- Semiconductor Device Design
Keithley 2400 Standard Series SMU
- Resistor/Resistor Network Production Test
- Connector, Relay, Switch Test
- Accelerated Stress Testing
- Circuit Protection Device Test
- Materials Research
SMU 2650 Series for High Power
- Power Semiconductor GaN, SiC
- Solar Panel Test
- Electromigration studies
- Semiconductor junction temperature characterization
SMU 2606B: High Density SMU
- VCSEL, Laser Diode Production Test
- LED Production Test
- Transistor Characterization
Software for your Source Measure Unit
Start sourcing and measuring in minutes, and develop your next application test
Keithley KickStart Instrument Control Software for Bench Instruments and Tektronix Oscilloscopes
Start measuring in minutes without complex programming. Perform I-V characterization and more.
Keithley I-V Tracer Software
The familiar user experience of a curve tracer for two-terminal devices for tracing characteristics through both current and voltage.